Method and system for calibrating an x-ray scanner from the image of at least one calibration standard

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United States of America Patent

PATENT NO 5225979
SERIAL NO

07884453

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Abstract

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A method and a system for calibrating an x-ray scanner, in which the lengths d.sub.ij of x-ray paths are first computed by means of the image of the calibration standard. There are then computed both the theoretical attenuations Ac.sub.ij and the attenuations Am.sub.ij measured on the image. There are then deduced the coefficient of proportionality K between the values Ac.sub.ij and Am.sub.ij in order to obtain values of K.times.Ac.sub.i. The values KAc.sub.i and Am.sub.i are employed for calculating the corrections to be made per channel as a function of the attenuation.

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Patent Owner(s)

Patent OwnerAddress
GENERAL ELECTRIC CGR S A13 SQUARE MAX HYMANS 75015 PARIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cornuejols, Dominique Palaiseau, FR 5 69
Feldman, Andrei Paris, FR 10 301

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