Total reflection X-ray fluorescence apparatus
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United States of America Patent
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Jun 15, 1993
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app pub date -
Dec 27, 1991
filing date -
Oct 19, 1989
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Abstract
A total reflection X-ray fluorescence apparatus comprises a base material having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector such as an SSD for detecting fluorescent X-rays emerging from a specimen located near the optically flat surface of the base material and a second detector such as a scintillation counter for detecting intensity of X-rays coming from the base material.
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