Method for the automatic determination of the exposure time of a radiographic film and system of implementation thereof

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United States of America Patent

PATENT NO 5218625
SERIAL NO

07726205

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Abstract

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The disclosure concerns radiology instruments that include an X-ray source, a receiver of the film or film-screen type, a detection cell and means to compute the yield at the cell. The method consists of performing measurements of the yield at instants t.sub.1, t.sub.2, . . . t.sub.3 during the exposure, so as to determine the lumination or luminous exposure (the quantity of the light received multiplied by the exposure time) on the film and then computing the lumination remaining to be acquired to obtain the chosen optical density on the film.

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Patent Owner(s)

Patent OwnerAddress
GENERAL ELECTRIC CGR S A13 SQUARE MAX HYMANS 75015 PARIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Heidsieck, Robert Versailles, FR 10 278

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