Method for determining concentrations by means of atomic emission spectroscopy
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United States of America Patent
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Jun 8, 1993
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N/A
app pub date -
Aug 20, 1990
filing date -
Aug 23, 1989
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Expired
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Abstract
A method for determining concentrations by means of atomic emission spectroscopy which contains the method steps: (a) generating an atomic emission with a known concentration of a looked-for element, (b) scanning the obtained emission spectrum by means of a spectral photometer with a spectral slit width in a wavelength range which contains a spectral line of the looked-for element, (c) generating an atomic emission with an unknown sample which contains the looked-for element with the concentration of the looked-for element in the unknown sample to be determined, (d) scanning the obtained emission spectrum by means of the spectral photometer with the same spectral slit width and in the same wavelength range in which the scanning of the emission spectrum with the known concentration was made, (e) processing the spectral-representing signal, which is provided by the spectral photometer independent of the wavelength by means of a recursive Kalman filter, in order to generate an estimate for the concentration of the looked-for element.
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