Electric device contact assembly
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United States of America Patent
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May 4, 1993
Grant Date -
N/A
app pub date -
Jul 3, 1991
filing date -
Jul 3, 1991
priority date (Note) -
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Abstract
A contact assembly for use in testing electric devices such as integrated circuits (IC's) and the like is comprised of a test socket and a corresponding carrier module for positioning the electric devices to be tested in alignment with the test socket. The carrier module is provided with a holding mechanism for retaining electronic devices to be tested in their proper position in the seat of the module, the holding mechanism being retractable so as to not interfere with the electrical contact between the socket and the electric device. In another aspect of the present invention, the contact assembly is provided with a slide positioning mechanism for slidably positioning the electronic device in its proper location on the seat of the carrier module.
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