Wafer scale of full wafer memory system, packaging method thereof, and wafer processing method employed therein

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United States of America Patent

PATENT NO 5191224
SERIAL NO

07627881

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Abstract

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To achieve higher packaging density and one wafer level for a full-sized wafer memory, or wafer-scale integration memory system, the wafers are vertically stacked with each other at a predetermined interval. A packaging technique is improved in such a way that a memory system layout can be precisely realized and a precise through hole can be formed. Moreover, other chips are fixed on the wafer so as to achieve furthermore the high packaging density.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDTOKYO 100-8280

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Enomoto, Minoru Tokorozawa, JP 65 582
Homma, Makoto Nishitama, JP 11 118
Ito, Kazuya Kodaira, JP 38 627
Kawamura, Masao Fuchu, JP 48 468
Kuroda, Shigeo Ohme, JP 17 412
Kurosawa, Hinoko Hino, JP 3 55
Mishimagi, Hiromitsu Akishima, JP 2 30
Nakamura, Hisashi Ohme, JP 80 1088
Otsuka, Kanji Higashiyamato, JP 72 2721
Sahara, Kunizo Nishitama, JP 6 570
Sakuta, Toshiyuki Nishitama, JP 27 776
Sasaki, Keiji Musashino, JP 55 572
Satoh, Toshihiko Sayama, JP 20 221
Tazunoki, Masanori Nishitama, JP 5 224

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