Parameter measurement systems and methods having a neural network comprising parameter output means
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United States of America Patent
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Jan 19, 1993
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N/A
app pub date -
Sep 3, 1991
filing date -
Sep 3, 1991
priority date (Note) -
Expired
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Abstract
A system for measuring the value of a parameter, e.g., structural strain, includes an optical waveguide, a laser or equivalent light source for launching coherent light into the waveguide to propagate therein as multi modes, an array of a plurality of spaced apart photodetectors each comprising a light receptor surface and signal output, said array being arranged to have light emitted from said waveguide output portion irradiate said light receptor surfaces, an artificial neural network formed of a plurality of spaced apart neurons, connectors to impose weighted portions of signal outputs from the photodetectors upon the neurons which register the parameter value on a meter or like output device.
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