Scanning radiation sensor for multiple spots and apparatus and method of averaging radiation samples of same

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United States of America Patent

PATENT NO 5173868
SERIAL NO

07600643

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Abstract

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A scanning radiation sensor (10) for individually determining temperature of a plurality of spots (16') along a scan line (16) on a target (12) responds to inputs to a light marking apparatus (21, 29, 40, 21) to determine which of a plurality of samples produced during a scan cycle are to be selected for averaging (54, 54'). Averages are determined for each scan (54, 54') and then averages for each scan are averaged over multiple scans (56). Both spot target samples (Ts) and reference source samples (Rs) are averaged for improved accuracy, with target samples being converted to temperatures (52) before averaging.

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Patent Owner(s)

Patent OwnerAddress
FLUKE CORPORATION6920 SEAWAY BOULEVARD EVERETT WA 98203

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ignatowicz, Steven A Wheeling, IL 3 48
Kalley, Eugene F St. Charles, IL 6 99

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