Engineered lighting system for TDI inspection comprising means for controlling lighting elements in accordance with specimen displacement
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United States of America Patent
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Dec 15, 1992
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N/A
app pub date -
Feb 20, 1991
filing date -
Feb 20, 1991
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Abstract
An engineered lighting system for high speed video inspection includes an array of light emitting diodes including light emitting diodes for use in time delay integration (TDI) inspection of web materials. The light emitting diodes of the array are selectively controllable to accomplish sequential illumination and carefully controllable imaging of a specified section of a continuously moving specimen or specimens. The system also includes an array of optional backlighting elements to aid in illumination of semi-opaque specimens to accomplish inspection thereof.
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