Method for forming a doped ZnSe single crystal

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United States of America Patent

PATENT NO 5169799
SERIAL NO

07684508

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Abstract

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A method of forming a ZnSe single crystal. The method includes placing a piece of ZnSe polycrystal in a sealed reactor tube with its atmosphere formed of certain gases. The reactor tube is moved through different temperature zones to convert the polycrystal to a single crystal. The single crystal thus formed is cut to produce a single crystal chip or wafer. An impurity is then implanted in the chip or wafer. Lastly the chip or wafer is heated to diffuse the impurity throughout the chip or wafer.

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Patent Owner(s)

Patent OwnerAddress
SUMITOMO ELECTRIC INDUSTRIES LTDOSAKA CITY OSAKA OF JAPAN OSAKA-SHI OSAKA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nanba, Hirokuni Osaka, JP 9 94
Taguchi, Tsunemasa Suita, JP 4 36

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