Scanning interferometer sensor system
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United States of America Patent
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Nov 24, 1992
Grant Date -
N/A
app pub date -
Oct 6, 1989
filing date -
Oct 6, 1989
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An on-line scanning sensor system includes a mid-infrared spectrophotometric analyzer, such as an interferometer, that can be used on-line in manufacturing environments. More particularly, the on-line scanning sensor system includes a first carriage for scanning motion across a traveling sheet of material; interferometer components that are carried by the first carriage and that includes devices for splitting and recombining infrared light, and for directing a collimated beam of the recombined light onto a traveling web of sheet material. Further, the system includes a detector system for receiving light from the interferometer components during scanning.
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