Adapter and test fixture for an integrated circuit device package
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United States of America Patent
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Nov 24, 1992
Grant Date -
N/A
app pub date -
May 24, 1990
filing date -
May 24, 1990
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A test fixture for a high pin count surface mounted IC device has a test head assembly connected to an adapter having electrically conductive elements that couple the output of the IC device to test points on the test head assembly. The test points are coupled to conductive pads on the test head assembly via conductive runs. The test head assembly conductive pads mate with conductive pad formed in the electrically conductive elements of the adapter. The conductive elements engage leads on the IC device providing conductive paths between the IC leads an the test points on the test head assembly. The test fixture is secured to the IC device by friction forces between the periphery of the IC device and the inner surface of the adapter. The test fixture or the adapter is usable as a low profile chip carrier by inverting the fixture or adapter and as a circuit board interconnect.
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