Electron imaging band pass analyser for a photoelectron spectromicroscope
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United States of America Patent
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Nov 24, 1992
Grant Date -
N/A
app pub date -
Mar 11, 1991
filing date -
Jul 9, 1988
priority date (Note) -
Expired
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Abstract
A low pass filter for use in an image band pass filter of a photoelectron spectromicroscope incorporating a virtual potential surface for reflecting electrons below a particular energy and a special charged particle trap or super dump for unwanted electrons. The filter construction with the super dump reduces the proportion of elastically and inelastically scattered high energy electron escaping the filter.
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