Bichannel radiation detection apparatus

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United States of America Patent

PATENT NO 5165796
SERIAL NO

07624205

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Abstract

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Apparatus for optically determining the temperature of an object in an environment at elevated temperature provides enhanced measurement accuracy by sensing radiation from the object in two or more different wavebands of radiation. The information derived therefrom is cyclically sampled and processed to provide corrected emissivity of the object. The temperature of the object is accurately determined from the corrected emissivity and sensed radiation therefrom. The apparatus includes a radiation detector for receiving radiation during an interval, an optical filter structure with a plurality of optical filters of different radiation transmissive characteristics, and sampling circuits for receiving the radiation signal from the detector during a selected period within the interval during which radiation is supplied to the detector; wherein the selected period is shorter than the interval, is determined in response to the cyclic operation of the filter structure, and contains the least amlitude gradient.

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Patent Owner(s)

Patent OwnerAddress
STEAG RTP SYSTEMS INC4425 FORTRAN DRIVE SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
French, Michael San Jose, CA 21 384
Gat, Arnon Palo Alto, CA 21 701

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