Ion source for a mass spectrometer
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United States of America Patent
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Nov 3, 1992
Grant Date -
N/A
app pub date -
Dec 12, 1991
filing date -
Dec 12, 1990
priority date (Note) -
Expired
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Abstract
An ion source for a mass spectrometer has a continuous flow probe (FIG. 2) having a mesh defining a surface, a capillary for supplying liquid sample to the surface and a porous body disposed at the periphery of the mesh. An ion source generates a beam of ionising radiation to which sample supplied to the surface is exposed. Sample supplied by the inlet tube spreads across the surface and surplus sample reaching the periphery of the mesh is absorbed by the porous body.
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