Apparatus and method for determining a center and measuring with reference thereto

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United States of America Patent

PATENT NO 5151870
SERIAL NO

07439231

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Abstract

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An object is positioned in fixed relation to a measuring axis without regard to centering the object on the axis and at least one series of data samples correlated to the distance between the measuring axis and a series of points located at angularly spaced intervals on at least one surface feature of the object are generated and stored. To determine the center of a first surface feature, the corresponding series of samples is analyzed to identify samples therein corresponding to points lying on a maximum inscribed circle whose center corresponds to that of the surface feature. To measure a second surface feature of an object with reference to the center of a first surface feature thereof, a first signal and a second signal correlated to the distance between the measuring axis and points on the first surface feature and second surface feature, respectively are generated. The center of the first surface feature is then determined to define a vector indicating the positional offset between the measuring axis and that center. The second signal is then adjusted in accordance with that vector to provide a coordinate-corrected signal to be used as a basis for a centered measurement.

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Patent Owner(s)

Patent OwnerAddress
MICRO-POISE MEASUREMENT SYSTEMS LLC A DELAWARE LIMITED LIABILITY COMPANY1624 ENGLEWOOD AVENUE AKRON OH 44305-4205

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beebe, James C Kent, OH 19 259
Cargould, Barry D Hudson, OH 12 146
Lees, Sr David W North Canton, OH 6 119

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