Thickness measuring system for nonconducting materials
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United States of America Patent
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Aug 11, 1992
Grant Date -
N/A
app pub date -
Aug 15, 1990
filing date -
Aug 15, 1990
priority date (Note) -
Expired
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Abstract
A device and method for detecting the thickness of an essentially nonconducting material during movement of the material within the dielectric between the plates of a capacitance detection probe is disclosed. The detection probe is electrically coupled to a material thickness analysis system containing an oscillator with an output frequency that is a related to the dielectric between the plates. Storage and analysis of output frequencies for the oscillator with and without the nonconducting material between the plates generates material thickness information.
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