Elastomeric test probe
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United States of America Patent
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Jul 28, 1992
Grant Date -
N/A
app pub date -
Jun 19, 1990
filing date -
Jun 19, 1990
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A test probe for testing electronic circuits is provided with a flexible conductive pad disposed at the end of the test probe. The flexible conductive pad is resilient so that when it makes physical and electrical contact with an electronic circuit, it compresses and does not damage either the electrical circuit or the probe itself.
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