Method of monitoring cement kiln and the apparatus therefor
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United States of America Patent
Stats
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Jun 23, 1992
Grant Date -
N/A
app pub date -
Apr 16, 1990
filing date -
Apr 17, 1989
priority date (Note) -
Expired
status (Latency Note)
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Abstract
There is provided a method of monitoring a firing condition in a cement kiln, by measuring an intensity of spectrum of a radiation which radiation is emitted from a clinker being fired in a cement kiln, and processing the intensity of the spectrum to produce a parameter for monitoring the condition in the kiln, by correcting the intensity profile of the spectrum by interpolating a profile (range) which is deformed by the absorption with alkali atom(s) in an atmosphere of the kiln. Further, the absorption intensity of the spectrum at a sodium absorption wavelength and potassium absorption wavelength should be continuously measured and corrected by interpolating so as to produce a parameter for monitoring. An apparatus for monitoring a cement kiln, comprises an optical head collector equipped at a kiln hood of the kiln, to collect a radiation from a clinker being fired in the kiln, an optical fiber for transmitting the collected radiation, a spectrophotometer for analyzing the collected radiation, which is connected to said optical fiber, and, a processor for processing said intensity of the spectrum measured by said spectrophotometer, outputing the processed data, and controlling the operation of the spectrophotometer. Further, the apparatus has said optical collector and said optical fiber mounted respectively on each of a plurality of the cement kilns, and a transfer switch(s) for selecting an optical head and an optical fiber connecting the kiln to be monitored, and then, a plurality of the cement kilns can be monitored.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
MITSUBISHI MINING AND CEMENT COMPANY LTD A CORP OF JAPAN | TOKYO |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Nakagawa, Masumi | Musashino, JP | 1 | 10 |
Takenouchi, Takeyoshi | Oumiya, JP | 3 | 25 |
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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