System for measuring thickness of high speed moving film
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United States of America Patent
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-
Mar 31, 1992
Grant Date -
N/A
app pub date -
Jan 22, 1990
filing date -
Jan 22, 1990
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An on-line capacitance sensing system, including a capacitance sensor, for measuring changes in thickness of a plastic film which passes over the sensor in contacting relationship; the sensor is mounted to a carriage which may be reciprocated transversely across the width of the film, and a partial vacuum is applied to the sensor to assist in holding the moving plastic film in contacting relationship against the sensor.
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