Gauge for measuring the thickness of a coating on a substrate

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United States of America Patent

PATENT NO 5094009
SERIAL NO

07599101

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Abstract

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A gauge for measuring the thickness of a coating on a substrate includes a housing, an indicator rod movably positioned within the housing, a magnet mounted on the forward end of the indicator rod, and a spring connected to the rearward end of the indicator rod. The housing can have a slot extending along a portion thereof that communicates with the interior of the housing. According to one embodiment, a measurement scale can be positioned adjacent to and extending along the length of the slot and a plurality of indicating marks can be provided on the rod for permitting the thickness of the coating to be determined. The particular indicating mark that is used for determining the thickness of the coating is dependent upon the orientation of the gauge relative to the force of gravity. According to another aspect of the present invention, the magnet can be fabricated from a combination of at least one light rare earth element and at least one heavy rare earth element.

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Patent Owner(s)

Patent OwnerAddress
DEFELSKO CORPORATIONP O BOX 676 802 PROCTOR AVENUE OGDENSBURG NY 13669

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Koch, Frank J Ogdensburg, NY 18 324
Walmer, Marlin S Lancaster, PA 3 25

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