Microwave excited helium plasma photoionization detector
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United States of America Patent
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Feb 4, 1992
Issued Date -
N/A
app pub date -
Mar 17, 1987
filing date -
Aug 11, 1983
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Expired
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Abstract
A photoionization detector for detecting effluents from a gas chromatographic column has a microwave induced helium plasma as the photon source. Since the source plasma may be at atmospheric pressure and need not be sealed, energy loss due to transmission of photons through a window can be eliminated. Use of alternating electromagnetic fields instead of a direct current discharge obviates the problems of anode sputtering.
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