Probe head for a coordinate-measuring machine
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United States of America Patent
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Jan 28, 1992
Grant Date -
N/A
app pub date -
Oct 4, 1990
filing date -
Oct 12, 1989
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The invention concerns a probe head of the so-called measuring type with scales which supply signals proportional to the position of a probe pin in its deflected state. A probe-pin carrier is the movable part of the probe head, being mounted indirectly on at least three intermediate bodies which, in their turn, are guided linearly in a fixed or housing part of the probe head. As a result of the symmetrical arrangement of the linear guides and the identical mass of intermediate bodies, like inertial responses characterize probe deflection in all directions in space. The workpiece-contacting force is, therefore, independent of coordinate direction in a dynamic operation of the probe head, as in the course of a continuous scan of a workpiece profile.
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