Method of measuring total ionization current in a segmented ionization chamber
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United States of America Patent
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Dec 10, 1991
Grant Date -
N/A
app pub date -
May 3, 1990
filing date -
May 3, 1990
priority date (Note) -
Expired
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Abstract
Information on radiation dosage from segmented ionization chambers can be incomplete due to the existence of insensitive regions of the chamber. By measuring the total current to the high voltage power supply, the total ionization current including that in the insensitive areas can be estimated, thereby providing a measure of the dosage to the insensitive areas.
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