Reactor analysis system
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United States of America Patent
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Oct 8, 1991
Issued Date -
N/A
app pub date -
Jul 22, 1988
filing date -
May 20, 1986
priority date (Note) -
Expired
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Abstract
Gas samples withdrawn from within a reactor vessel (or process in general), as well as from one feed gas thereto, are passed to gas analyzers for particular components or impurities desired to be measured. The response time of the reactor analysis system employed is advantageously minimized by the elimination of dead gas space within the system and the provisions for rapid purging of the system or of individual gas analyzer feed lines. The flexibility of the system to measure both particular gas sample components and periodically present impurities using the same analytical instruments is generated by the addition of an in-line reaction system comprised of reactant addition means and/or catalyst means to individual sample lines leading to particular analytical instruments.
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