Electro-optical ion detector for a scanning mass spectrometer and method of making same
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United States of America Patent
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Oct 1, 1991
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app pub date -
Nov 19, 1990
filing date -
Feb 21, 1989
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Abstract
An improved electro-optical ion detector comprising a channel electron multiplier assembly located at the angled focal plane of the magnetic sector of a scanning mass spectrometer with a twisted fiberoptic window with a means for precisely optically coupling the assembly to the twisted fiberoptic window. Means are provided for precisely spacing the entrance end of said twisted fiberoptic window in the form of a foil of a selected thickness. Also disclosed is a method for making an improved electro-optical ion detector.
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