Method for chemically analyzing a test piece
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United States of America Patent
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-
Aug 13, 1991
Grant Date -
N/A
app pub date -
Apr 8, 1988
filing date -
Apr 11, 1987
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An apparatus for chemically analyzing a sample on a test piece that includes a reagent layer, comprises a test piece table for positioning a test piece thereon, and an applying station wherein a sample may be applied to the reagent layer. The test table moves to a position below a row of holes with the reagents aligned to the holes and a sample is applied to each reagent layer from a nozzle, the samples passing through the respective holes. Covers are moved over the holes after the samples are applied and the test pieces are moved to a measuring station for measuring the reaction between the sample and reagent layer. Photometric techniques are used in evaluating the reaction. Opening and closing of the covers is controlled by motion of the sample dispensing nozzle as it moves from one opening to the next.
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