Method and apparatus for measuring characteristics of a multilayer product

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United States of America Patent

PATENT NO 5020356
SERIAL NO

07398757

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and apparatus are disclosed wherein a plurality of basis weight sensors are interleaved with one or more processing stations used to conjoin or apply one or more layers to a base substrate to form a multilayer product such that a sensor is located on the input and output sides of each processing station. Each of the sensors can be calibrated with a plurality of product calibrations such that multiple output signals corresponding to multiple products can be generated simultaneously by the sensors. Each of the sensors is calibrated with product calibrations corresponding to the product or intermediate stage of the product which it monitors, the layer applied by the processing station preceding it, if any, and the layer applied by the processing station succeeding it, if any. Signals generated by the sensors may then be used directly to determine the basis weight of the resulting product and/or each intermediate stage of the product, or the signals may be processed to determine the basis weight of each layer of material of the resulting product independent of the substrate to which the layer was applied. Substrate independent layer measurement is performed by subtracting the output signal generated by the sensor preceding the processing station applying the layer based on the product calibration corresponding to the layer from the output signal generated by the sensor succeeding the processing station applying the layer based on the product calibration corresponding to the layer.

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Patent Owner(s)

Patent OwnerAddress
ABB INDUSTRIAL SYSTEMS INC650 ACKERMAN ROAD COLUMBUS OH 43202

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dukes, John R Worthington, OH 2 7

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