Ultrasonic thickness measuring method and apparatus
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Apr 23, 1991
Grant Date -
N/A
app pub date -
Jan 31, 1989
filing date -
Feb 1, 1988
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An ultrasonic thickness measuring method and apparatus in which an ultrasonic pulse is transmitted from a probe to a material to be measured and resulting multiple reflection pulses from the material to be measured are detected to obtain a time interval between the reflection pulses for measuring the thickness of the material. This method and apparatus features, for example, comprises counting a time from transmission of the ultrasonic pulse to reception of a first reflection pulse from a bottom of the material to be measured; detecting a pulse received within a preset period of time after said first reflection pulse has been received and just before a time corresponding to the counted time has passed, as a second reflection pulse; and counting a time between the reception of the first reflection pulse and the reception of the second reflection pulse to measure the thickness of the material.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully