Electro-optical ion detector for a scanning mass spectrometer

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United States of America Patent

PATENT NO 4994676
SERIAL NO

07544798

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Abstract

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A scanning mass spectrometer (10) in combination with an electro-optical detector (100) which enable greatly increased speed of mass determinations by detecting a limited range of masses simultaneously, thus reducing the number of discrete magnetic field adjustments required over a large range of masses. The electro-optical detector (100) includes a channel electron multiplier assembly (94) with the surface of an image plate (80) located along the ion focal plane (44) and at an angle to the exit plate (106) of the magnetic sector (26) and a fiberoptic window (134) of a special shape optically coupled between the angled image plate (80) and a photodiode detector array (140). The fiberoptic window (134) is shaped in such a way as to enable the entrance ends (entrance plane) (144) of the fibers to be parallel to the angled image plate (80) and the exit ends of the fibers (exit or second image plane) (146) to be parallel to the exit plane (106) while maintaining the ends of the fibers perpendicular to the fiber axes. The channel electron multiplier assembly (94) is within a vacuum envelope (104) and the photodiode array (140) is outside the vacuum envelope (104).

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Patent Owner(s)

Patent OwnerAddress
PERKIN ELMER LLC761 MAIN AVENUE NORWALK CT 06859

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mount, Bruce E 21810 Manada Ct., Diamond Bar, CA 91765 13 246

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