Nonlinear averaging compensated measurements

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United States of America Patent

PATENT NO 4990784
SERIAL NO

07399224

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Method and apparatus for measurement and control of an industrial process by detecting the average transmittance of a radiation beam which passes through the process material. A radiation source (28) having an intensity I.sub.o is positioned on one side of the material to be measured and a suitable radiation detector (32) is positioned on the other side. The transmitted radiation intensity, I, is measured by the sensor. An index Z commensurate with the degree of nonuniformity of the variable in the material is determined, and a process signal is generated from a quantitative relationship among I, I.sub.o, and the index Z. In a first embodiment implementedd in a system for measurement and control of the basis weight of paper in a paper production process, the index Z is indicative of the nonuniformity of the material mass distribution in the sheet and is determined by measurements with a separate formation gauge operating on-line with, but independently of, the basis weight sensor. In a second embodiment of the invention implemented in such a paper making process, the index Z commensurate with the degree of nonuniformity for the mass in the material, is derived from the standard deviation of the detected radiation intensity signal, or the equivalent standard deviation of the basis weight output signal.

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Patent Owner(s)

Patent OwnerAddress
ABB INDUSTRIAL SYSTEMS INC650 ACKERMAN ROAD COLUMBUS OH 43202

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dukes, John R Worthington, OH 2 7
Thompson, Mason L Worthington, OH 1 4

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