Method and apparatus for texture analysis
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United States of America Patent
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-
Jan 1, 1991
Grant Date -
N/A
app pub date -
Jul 27, 1989
filing date -
Jul 29, 1988
priority date (Note) -
Expired
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Abstract
In analyzing the texture of rolled metal sheets and strips by means of X-rays or .gamma.-rays that penetrate them, the total beam emitted by the source of radiation is divided by collimators into several component beams, and each component beam is aimed at a different angle at a component area of the sheet or strip being tested. The diffracted radiation that penetrates the sheet is analyzed in accordance with its energy distribution in detectors and the results are processed in a computer.
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