Method and apparatus for identifying causes of repeatability problems in near infrared analytical instruments

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United States of America Patent

PATENT NO 4969115
SERIAL NO

07274836

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Abstract

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A method and apparatus for determining whether a subsequent sample is substantially identical to an initial sample in a near infrared quantitative analysis instrument. An initial sample is measured for a plurality of characteristics which include the ambient temperature of the analysis instrument at the time of reading, the temperature of the sample itself, the optical energy level of the sample, the moisture content of the sample, and the percent protein of the sample. These characteristics are stored in a computer to provide a series of comparison criteria. A subsequent sample is then measured for the same characteristics as the initial sample and these characteristics are compared to the comparison criteria to determine if the subsequent sample is substantially identical to the previous sample. The subsequent sample is determined to be substantially identical to the initial sample for a given criterion if the subsequent sample's measurement for the corresponding characteristic is within a tolerance for that criterion. If the subsequent sample is judged to be substantially identical to the initial sample for all criteria, it is determined to be substantially identical to the initial sample.

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Patent Owner(s)

Patent OwnerAddress
FUTREX INCP O BOX 2398 GAITHERSBURG MD 20886

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Rosenthal, Robert D Gaithersburg, MD 47 4886

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