Probe for magnetic resonance spectrometric measures at very high temperatures
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United States of America Patent
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Sep 18, 1990
Grant Date -
N/A
app pub date -
Mar 1, 1989
filing date -
Mar 1, 1988
priority date (Note) -
Expired
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Abstract
A probe for spectrometric measurements of magnetic resonance at very high temperatures includes a resonator (3) within which is disposed a sample (9) to be analyzed. A laser beam from a laser (6) is conducted toward and focused upon the sample (9) for heating the same, and levitation of the sample (9) during measurement proceedings within the resonator (3), as a means of thermally isolating the sample (9) from its surroundings, is achieved by means of a levitation gas from a gas source (18) which is introduced into the resonator (3) by means of a constriction zone aperture (17) whereby the sample (9) is maintained within an upper cavity (16) of the resonator (3).
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