Interferometer with thin absorbing beam equalizing pellicle
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United States of America Patent
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Sep 11, 1990
Grant Date -
N/A
app pub date -
Dec 9, 1988
filing date -
Dec 9, 1988
priority date (Note) -
Expired
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Abstract
An interferometer includes a thin, absorbing pellicle in the path of a test beam to attenuate the test beam so that its intensity is approximately equal to the intensity of a reference beam. The pellicle reflects less than about six percent of the test beam, thereby avoiding spurious reflections that produce spurious fringes.
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