Apparatus for testing and sorting electronic components, in particular IC's
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United States of America Patent
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-
Mar 13, 1990
Grant Date -
N/A
app pub date -
Nov 10, 1987
filing date -
Nov 11, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An apparatus for testing and sorting electronic components (33), in particular IC's, is directly mounted on the mounting (2a, 2b to 10a, 10b), preferably forming part of a manipulator, for a test computer. In order to convey the components (33) between an input magazine (16), a testing head (20) and an output magazine (17) a suction head (20) is provided which is movable on a carriage guide (15) and which may be lowered. The mounting forming part of the manipulator permits the test computer (1) and the whole apparatus arranged on a slope so that the components (33) in the magazine rods (26) of the input magazine (16) and the output magazine (17) slide forwards under gravity.
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