Semiconductor integrated circuit having a DC test function
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United States of America Patent
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Feb 27, 1990
Grant Date -
N/A
app pub date -
Dec 1, 1988
filing date -
Dec 4, 1987
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An integrated circuit receiving an input signal and producing output signal including: a set/reset circuit, operatively connected to an internal main circuit, being set in response to the first signal and reset in response to the second signal in a normal mode; an output buffer circuit, connected to the set/reset circuit, for producing the output signal in response to an output of the set/reset circuit; and a control circuit, connected between the internal main circuit and the set/reset circuit, receiving the first signal, a reset signal for initializing the internal main circuit, the first signal, the second signal, and a first test signal, during a DC test mode, the control circuit resetting the set/reset circuit in response to a receipt of the reset signal regardless of the second signal and setting the set/reset circuit in response to a receipt of the first test signal regardless of the reset signal and the first signal.
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