Method and device for analyzing and measuring physical parameters of a layered material by thermal radiometry
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United States of America Patent
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Oct 17, 1989
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N/A
app pub date -
Feb 5, 1987
filing date -
Feb 6, 1986
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Expired
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Abstract
A method and a device are used to analyze and measure by means of radiometry physical parameters of a layered material. These parameters include the absorptivity B, the diffusivity A of the surface layer and the thermal resistance R of the interface between the two layers. A sample of the material is excited by means of a flux of thermal energy amplitude modulated at a high frequency and a low frequency. The parameters are computed from the measured phase shift and amplitude of the resulting thermal signal. The method and the device are applicable to non-destructive testing of industrial products.
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