Methods and apparatus for frequency response analysis
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United States of America Patent
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Sep 19, 1989
Grant Date -
N/A
app pub date -
Feb 8, 1988
filing date -
Feb 7, 1987
priority date (Note) -
Expired
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Abstract
In a frequency response analyser for operation at high frequencies a signal of frequency F for application to a system under test (15) is generated from a frequency synthesizer (11) capable of operation only at a relatively lower frequency F/K by generating a first signal (19) of frequency at the relatively lower frequency F/K by generating a second signal 104 at the relatively higher frequency (f+F) and generating a third signal (at 114) or F(1--1/K). The second signal is applied to the system under test and an output signal (at 16) derived therefrom. The output is multiplied by the third signal to provide a product signal, and the product signal is analyzed with respect to first signal by means of a correlator 14. The present invention overcomes the limitation in maximum testing frequency imposed by the frequency synthesizers of prior art frequency response analyzers.
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