Double-focusing mass spectrometer having Wien filter and MS/MS instrument using such spectrometer
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 12, 1989
Grant Date -
N/A
app pub date -
Apr 12, 1988
filing date -
Apr 15, 1987
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A double-focusing mass spectrometer comprising a Wien filter and a homogeneous magnetic field. Daughter ions produced from parent ions of a certain ionic species differ in mass but have velocities substantially equal to that of the parent ions. The Wien filter is set up such that the velocities of the daughter ions satisfy the Wien condition. Thus, the daughter ions originated from the specified parent ions pass through the filter and are dispersed according to mass by the homogeneous magnetic field and focused into a focal plane. A two-dimensional ion detector is disposed along this focal plane in order to simultaneously detect said daughter ions and to obtain a spectrum of the daughter ions.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully