Apparatus for examining objects
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United States of America Patent
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Aug 15, 1989
Grant Date -
N/A
app pub date -
Apr 22, 1986
filing date -
May 22, 1985
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Apparatus for examining the shape and/or dimensions of an object wherein an object is fed to a test station (12) on a stepping conveyor (14), the object is illuminated within the test station and scanned by two linear charge-coupled camera devices (18, 20) acting in mutually perpendicular directions across and along the conveyor. Logic circuitry processes the video signals to provide raw measurement signals fed into a microprocessor for analyzing the signals and for providing control signals for a downstream reject mechanism.
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