Method and apparatus for measuring settling characteristics of a device under test by using a measurement system for measuring an input signal by sampling and digitizing said input signal
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United States of America Patent
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May 23, 1989
Grant Date -
N/A
app pub date -
Oct 5, 1987
filing date -
Oct 8, 1986
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and an apparatus for measuring settling characteristics of a device under test. A measurement system for measuring an input signal by sampling and digitizing that input signal is employed to obtain reference data by measuring a reference signal, at least one level of which is flat, and to obtain measurement data by measuring a second signal representing the settling characteristics to be measured but containing an error component due to inclusion of the measurement system itself. The error component is removed from the measurement data by adjusting the timing and level of the reference data relative to those of the measurement data.
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