Echometer for locating defects which affect light conductors
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United States of America Patent
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May 2, 1989
Issued Date -
N/A
app pub date -
Jun 28, 1982
filing date -
May 31, 1977
priority date (Note) -
Expired
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Abstract
An echometer which translates an optical signal into the centimetric or decimetric wave bands. A test signal and the local oscillator signal are provided by a single laser oscillator. The test signal and the local oscillator signal, which are 90.degree. different in phase, are modulated at centimetric or decimetric frequencies, and detected by mixing echo signals and the local oscillator signal with a photodiode or the like.
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