Methods for use in the mass analysis of chemical samples
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United States of America Patent
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Apr 11, 1989
Grant Date -
N/A
app pub date -
Aug 21, 1985
filing date -
Aug 21, 1985
priority date (Note) -
Expired
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Abstract
A probe and method for using the same for supporting a sample in an ion source of a mass spectrometer comprises a target formed by a receptacle for a liquid sample in which the sample passes by diffusion to the high vacuum side of a semipermeable membrane and/or in which the sample is held as a droplet by surface tension. In order to replenish the droplet surface, the supply can be arranged to overflow the receptacle.
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