Apparatus for measuring characteristics of electronic devices
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United States of America Patent
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-
Apr 4, 1989
Grant Date -
N/A
app pub date -
Jan 5, 1988
filing date -
Aug 18, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An electronic device measurement apparatus measures a characteristic of an electronic device under test (DUT) by applying a smoothly changing voltage from one terminal of a voltage supply to an ungrounded terminal of the DUT and detecting a current flowing through the DUT. The current flowing through the DUT does not include a looping error component. A current detection resistor is connected between another terminal of the voltage supply and a grounded terminal of the DUT. Since the voltage applied to the DUT is a sine squared wave voltage, the pure current flowing through the DUT is detected by detcting cosine-wave and sine-wave components from the ungrounded terminal of the DUT and obtaining the difference between the voltage across the current detection resistor and the cosine-wave and sine-wave components.
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