Method and apparatus for near infrared reflectance measurement of non-homogeneous materials
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United States of America Patent
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Jan 31, 1989
Grant Date -
N/A
app pub date -
Sep 30, 1986
filing date -
Sep 30, 1986
priority date (Note) -
Expired
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Abstract
A method and apparatus for near infrared reflectance measurement of non-homogeneous materials. Constituents of a material are quantitatively analyzed by reflectance techniques utilizing a planar surface of the material within a cup-shaped sample holder opaque to near-infrared radiation. A predetermined area of the planar surface is uniformly irradiated with near infrared radiation emitted from a source spaced a predetermined distance away from the planar surface. Near infrared radiation reflected by substantially all of the predetermined surface area is detected with a near infrared radiation detector spaced a predetermined distance away from the planar surface, to provide a signal which is processed to measure an average content of a constituent in the sample material. The source and detector are contained in a probe which is calibrated by inserting the probe into a cavity. The probe is spaced from the bottom of the cavity such that the cavity reflectance is about equal to that of the material for which the probe is being calibrated.
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