System for measuring laser spectrum

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United States of America Patent

PATENT NO 4790655
SERIAL NO

06859993

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Abstract

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A system for measuring laser spectrum is disclosed in which the laser light to be measured is branched into one branched light and the other branched light so that the laser spectrum of the light is measured from a beat output resulting from mixing a delayed light obtained by delaying the one branched light for a certain period of time with the other branched light undelayed. In accordance with the present invention, the delay time of the delayed light undergoes such variations as to assume a value equal to an integral multiple of a fixed delay time by the use of an optical directional coupler.

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Patent Owner(s)

Patent OwnerAddress
KDD SUBMARINE CABLE SYSTEMS INC (KDD-SCS)KDD BLDG 3-2 NISHI-SHINJUKU 2-CHOME SHINJUKU-KU TOKYO 163-8

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mochizuki, Kiyofumi Hachioji, JP 14 345
Yamamoto, Shu Chofu, JP 85 1467

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