Fluorescent X-ray analyzing method of solution specimen and specimen sampler used for the method

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4788700
SERIAL NO

06928657

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

For analyzing the solution specimen according to the fluorescent X-ray analyzing method, a certain quantity of solution specimen to be analyzed is impregnated into a thin porous sheet, for example by dripping method, and the sheet is dried for evaporating the solvent. Held on an appropriate holder, for example, the sheet is placed in the vacuum atmosphere or the atmosphere of helium gas, so that the primary X-rays are irradiated and the wavelength or the intensity of the fluorescent X-rays generated from the solute remained in the sheet may be detected. The concentration of the solution may be changed by concentration or by dilution, so that an adequate intensity of the fluorescent X-ray may be generated. The specimen sampler is made of porous sheet material, to which the solution specimen to be analyzed is impregnated and dried to remain only the solute of the solution in the sheet. To the circumferential edge of the sheet is attached a circular edge of a support, so that the central portion of the porous sheet is sufficiently spaced from the circumferentially provided support.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
RIGAKU INDUSTRIAL CORPORATIONTAKATSUKI-SHI OSAKA-FU 569-1146

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Abe, Tadahiro Chiba, JP 5 61
Kurozumi, Shigetoshi Settsu, JP 1 3
Maruyama, Hideo Mukou, JP 11 193
Yasui, Noriko Yachiyo, JP 1 3

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation