Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis
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United States of America Patent
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Nov 15, 1988
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N/A
app pub date -
Apr 25, 1986
filing date -
Oct 31, 1983
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Expired
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Abstract
X-ray dispersive and reflective structures and materials are constructed which exhibit improved characteristics in specific ranges of interest. The structures are formed of metallic and non-metallic layer pairs. The structures are formed of alternating layers of Cr:C, Ni:C or V:C for carbon analysis and Mo:B.sub.4 C for beryllium an boron analysis. The layered structures can be formed from Ni:C for analysis of both carbon and boron.
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