Method of and arrangement for measuring low capacitances
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United States of America Patent
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Oct 4, 1988
Issued Date -
N/A
app pub date -
Nov 13, 1986
filing date -
May 31, 1984
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Method of and arrangement for measuring low capacitances include generating a periodic frequency signal having time periods of duration dependent on capacitance, and alternately connecting an unknown capacitance to be measured and a known reference capacitance, one after the other, to a frequency generator for an equal number of time periods of the frequency signal. Each time period has a first and a second time interval proportional to the reference capacitance and the unknown capacitance, respectively. A DC voltage output signal proportional to the unknown capacitance being measured is generated in response to the durations of the first and second time intervals. The DC voltage output signal is preferably scaled, linearized and temperature compensated.
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